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  Estonian Journal of Engineering

ISSN 1736-7522 (electronic)  ISSN 1736-6038  (print)

 An international scientific journal
Formerly: Proceedings of the Estonian Academy of Sciences Engineering
(ISSN 1406-0175)
Published since 1995

Estonian Journal of Engineering

ISSN 1736-7522 (electronic)  ISSN 1736-6038  (print)

 An international scientific journal
Formerly: Proceedings of the Estonian Academy of Sciences Engineering
(ISSN 1406-0175)
Published since 1995

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Correlation between hardening depth and thermal parameters based on photothermal measurements; 423–435

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Authors

Dennis Kruse, Helmut Prekel, Gert Goch, Heinz G. Walther

Abstract

In steel hardening processes, laser treatments and wear or machining of ceramics, the microstructural variations of the material are combined with variations of the thermal properties and therefore become detectable by non-destructive photothermal methods. This paper presents the theoretical basis of a parameter profile reconstruction, based on photothermally measured data. It compares numerical approach using the finite difference method with analytical solution, derived directly from the thermal diffusion equation. Both models are applied to photothermal measurements, leading to depth profiles of steel hardness, which are compared with data, destructively obtained from the same samples using Vickers indentation techniques.

Keywords

hardness, non-destructive measurements, thermal diffusion.

References

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  2. Kruse , D. , Prekel , H. and Goch , G. Automated photothermal detection of burning and hardening depth. In Proc. 9th International Conference on Infrared Sensors & Systems. Nürnberg , 2006 , 341–346.

  3. Goch , G. , Schmitz , B. and Reick , M. Photothermal sensing techniques for measuring material properties and near-surface defects. Ann. CIRP , 1994 , 42 , 623–626.

  4. Goch , G. , Geerkens , J. , Reick , M. and Schmitz , B. Analysis of surface layer variations by photothermal means. J. Physique IV , 1994 , 319–322.

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  7. Ritter , R. , Reick , M. , Schmitz , B. and Goch , G. Nondestructive and contactless evaluation of surface coatings and adhesion defects by photothermal radiometry. Proc. SPIE , 1996 , 2782 , 662–673.
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  8. Seidel , U. , Lan , T. T. N. , Walther , H. G. , Schmitz , B. , Geerkens , J. and Goch , G. Quantitative characterization of material inhomogeneities by thermal waves. Opt. Eng. , 1997 , 36 , 376–390.
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  9. Lan , T. T. N. , Seidel , U. and Walther , H. G. Theory of microstructure depth profiling by photo­thermal measurements. J. Appl. Phys. , 1995 , 77 , 4739–4741.
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10. Lan , T. T. N. and Walther , H. G. Photothermal depth profiling using only phase data. J. Appl. Phys. , 1996 , 80 , 5289–5291.
doi:10.1063/1.363516

11. Reigl , M. Methoden zur Quantifizierung photothermischer Signale. PhD Thesis , Universität Ulm , 1997.

12. Lan , T. T. N. , Seidel , U. , Walther , H. G. , Goch , G. and Schmitz , B. Experimental results of photothermal microstructural depth profiling. J. Appl. Phys. , 1995 , 78 , 4108–4111.
doi:10.1063/1.359869

 
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Current Issue: Vol. 19, Issue 4, 2013





Publishing schedule:
No. 1: 20 March
No. 2: 20 June
No. 3: 20 September
No. 4: 20 December